Averna Technologies: Testing Tool: Channel Emulator Based on NI's Vector Signal Transceiver
Aug. 12, 2012
Averna, an industry-leading developer of test solutions and services for communications and electronics device-makers worldwide, announces the availability of the DOCSIS Channel Emulator (DCE), which is the first National Instruments’ Partner product to integrate and support NI’s brand-new Vector Signal Transceiver (VST) solution.
Averna, an industry-leading developer of test solutions and services for communications and electronics device-makers worldwide, announces the availability of the DOCSIS Channel Emulator (DCE), which is the first National Instruments’ Partner product to integrate and support NI’s brand-new Vector Signal Transceiver (VST) solution. From August 7-9, Averna will be demoing the DCE at NIWeek 2012 in Austin, TX (Booth 601/607).
The DCE ensures that modems, set-top boxes and gateways are resilient to cable plant and field interruptions so that equipment makers and multiple system operators (MSOs) can deliver the highest level of service. As this industry moves to high channel counts – 24-bonded downstream channels and
8-bonded upstream channels – the DCE cost-effectively enables the impairment of these channels while maintaining synchronization between headend (HE) and customer-premises equipment (CPE).
To accomplish this, Averna deployed its industry and test expertise, as well as a suite of NI hardware and software products, including LabVIEW and the VST’s embedded field-programmable gate array (FPGA), which Averna has programmed to produce the real-time impairments such as phase noise, AWGN and micro-reflections. This provides a flexible, low-latency path for DOCSIS and EuroDOCSIS signals that the VST acquires, processes and regenerates for analysis and troubleshooting purposes.
“The cable and broadband industry will greatly benefit from this highly adaptable, software-based instrumentation solution,” said Averna’s Jean-Levy Beaudoin, Director of Business Development. “The DCE provides a significant competitive advantage over traditional hardware-based instruments, enabling MSOs and device-makers to efficiently test and achieve industry certifications such as SCTE 40 faster than ever.”